The Certification of 100 MM Diameter Silicon Resistivity Srms 2541 Through 2547 Using Dual-Configuration, Four-Point Probe Measurements, 1999 Edition (Classic Reprint) [James R Ehrstein] on *FREE* shipping on qualifying The Certification of 100 MM Diameter Silicon Resistivity Srms 2541 Through 2547 Using Dual-Configuration, Four-Point Probe Measurements, 1999 Edition (Classic Reprint) [James R. Ehrstein] on *FREE* shipping on qualifying The Certification of 100 MM Diameter Silicon Resistivity Srms 2531 Through 2547 Using Dual-Configuration Four-Point Probe Measurement, 2006 Edition. This This Special Publication summarizes the certification procedure for a new generation of silicon resistivity Standard Reference Materials 2541 through 2547. The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements.
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